Tourbillonnant 1000-1750 nm
Eliminate spectral gaps in the infrared region. Learn how custom Chinese SWIR LED arrays replicate atmospheric water absorption troughs for perfect AM1.5G simulation.
Overcoming the Infrared Ceiling: Why Custom SWIR LED Arrays are Vital for Next-Gen PV Testing
When developing tandem solar cells or multi-junction photovoltaics, measuring spectral response up to 1100nm is no longer enough. The short-wave infrared (SWIR) spectrum between 1100nm and 2000nm contains nearly half of the sun’s total thermal energy. Replicating this region accurately is the new frontier for solar simulator design.
Cependant, engineers frequently complain about the “spectral gaps” and artificial “spikes” found in generic infrared simulators. This occurs because off-the-shelf SWIR LEDs feature broad, uncontrollable bands that fail to replicate the complex water vapor absorption troughs of the standard AM1.5G spectrum.
The Solution: Chip-Level Customization from Chinese SWIR Specialists
By partnering directly with a Chinese manufacturer that owns its LED packaging foundry, researchers can design bespoke SWIR solar simulator modules. Rather than settling for fixed commercial wavelengths, you can request custom chip tuning:
| Target Wavelength | Primary Application / Solar Matching | Key Packaging Tech Required |
|---|---|---|
| 1200nm – 1350nm | Simulating Peak IR Solar Irradiance | High-efficiency InGaAs Die-bonding |
| 1450nm Trough | Replicating Atmospheric H₂O Absorption | Precision FWHM (Full Width at Half Max) Narrowing |
| 1650nm – 1800nm | Tandem Cell Bottom Junction Testing | Advanced Eutectic Soldering for High Thermal Loads |
| 1900nm – 2000nm | Extreme Broadened IR Boundary Simulation | Anti-reflective Coated Sapphire Windows |
Eradicating the “Rainbow Effect” via Single-Point Mixing
Another common headache when using multiple individual SWIR diodes is spatial non-uniformity—where the edges of your test area receive different infrared intensities than the center. Leading Chinese designers solve this by integrating diverse SWIR dies onto a high-density, matrix-mapped substrate under a single Total Internal Reflection (TIR) optical lens. This forces all wavelengths to mix at the source, guaranteeing a uniform, Class AAA light field across your entire device under test (DUT).
